Lattice Semiconductor announced the latest release of the Lattice sensAI solution stack, delivering expanded model support, ...
Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
"The era of error-prone quality control is over," said Keven, CEO of UnitX. "With FleX, we achieve optimal accuracy with the easiest deployment tools--minimize downtime, enable scalable deployment, ...
ELECTRONICS/SOTWARE: Cognex Corporation launched VisionPro® Surface, a vision software package for inspecting the surface of materials. VisionPro Surface combines a revolutionary new visual defect ...
Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
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