Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...

Process mapping is one of the basic quality or process improvement tools used in Lean Six Sigma. It has acquired more ...

As the new manufacturing engineer for the stapler production line, you find yourself shifting through quality data to get a better understanding of the defect rates involved. One of the reasons you ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

Apriso, a leading provider of manufacturing software solutions, today announced that its FlexNet Quality application now includes visual Quality Defect Tracking (vQDT), which embeds visual imagery of ...

The PV industry has been playing a game of ‘whack a mole’ in tackling module defects over the past decade. Image: Kiwa PI Berlin. Solar modules manufactured in countries such as the United States, ...