Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...

Microscopy continues to transform the life sciences. Here are five recent breakthroughs made possible by the technique.

Goethe University Frankfurt (Germany) ceremonially commissioned a state-of-the-art cryo plasma-FIB scanning electron microscope with nanomanipulator worth more than 5 million euros on Thursday. The ...

The Thermo Scientific Quattro ESEM offers comprehensive performance in both imaging and analytics, featuring a distinctive environmental mode (ESEM) that enables the examination of samples in their ...

A team of researchers at the University of Victoria (UVic) have achieved an advance in electron microscopy that will allow scientists to visualize atomic-scale structures with unprecedented clarity ...

Breakthroughs, discoveries, and DIY tips sent six days a week. Terms of Service and Privacy Policy. Electron microscopy has existed for nearly a century, but a record ...

A £3 million electron microscope has arrived at the University of Oxford's Department of Materials. The microscope will support research across the university's departments and divisions. It was ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

There are a lot of situations where a research group may turn to an electron microscope to get information about whatever system they might be studying. Assessing the structure of a virus or protein, ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...