Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
Assessing the robustness of an electronic product is integral to successful design and performance. Highly accelerated life testing (HALT) is an important testing tool for this purpose, and its ...
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